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Editors contains: "Troubitsyna, Elena"

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  1. ; ; (, IEEE)
    Ghosh, Sudipto; Troubitsyna, Elena; Chen, Zhenyu (Ed.)
    When we quantify the effectiveness of a test suite by its mutation coverage, we are in fact equating test suite effectiveness with fault detection: to the extent that mutations are faithful proxies of actual faults, it is sensible to consider that the effectiveness of a test suite to kill mutants reflects its ability to detect faults. But there is another way to measure the effectiveness of a test suite: by its ability to expose the failures of an incorrect program. The relationship between failures and faults is tenuous at best: a fault is the adjudged or hypothesized cause of a failure. The same failure may be attributed to more than one fault. This raises the question: what is the relationship between detecting faults and exposing failures. In this paper, we discuss an empirical experiment in which we explore this relationship. 
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